Park Systems launches Park FX40 IR

Park Systems, a global leader in nanometrology, announced the commercial launch of the Park FX40 IR. This new product completes the company's Nano-IR spectrometer portfolio with a small-sample platform, enabling researchers to simultaneously acquire nanoscale IR chemical information and surface topography with sub-5 nm spatial resolution. The Park FX40 IR is built on the existing Park FX40 IR platform, which is known for its automation and mechanical stability. This non-contact Photo-induced Force Microscopy (PiFM) approach surpasses the optical diffraction limit of conventional FT-IR and contact-based photothermal techniques, eliminating sample damage and tip contamination. Dr. Sang-Joon Cho highlighted the fully integrated nature of the platform. Park Systems also introduced a phased acquisition path, allowing laboratories to upgrade their existing Park FX40 IR systems to include the IR module.